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The two pictures below show the extremes in resolution. | ||
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On the left hand side is a weak beam image of a dislocation network in a small angle grain boundary in Si; it has optimum resolution. The dislocation end at a SiO2 precipitate which shows faint fringes due to Moirée effects (the Si precipitate is sandwiched between Si crystals which are slightly misoriented). | ||
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On the right hand side is the same area imaged with (rather dynamical) bright field conditions. The dislocation lines are very broad and their images interfere with each other; it would be difficult to interpret this picture. | ||
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6.3.2 Examples and Case Studies for Dislocations
© H. Föll
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